Title :
Design, fabrication and performance of a 1024-bit bucket-brigade shift register
Author :
Maul, M.K. ; Strain, R.J.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
Abstract :
In order to provide a general-purpose dynamic shift register, and to demonstrate the LSI capabilities of the bucket-brigade class of MOS circuits, a 1024-bit bucket-brigade dynamic shift register chip has been designed and built. This chip is organized as four 256-bit registers with common clocking. It operates up to 1 MHz with a 10 V p-p clock swing. Digital regeneration has been included at 16-bit intervals to offset the degradation of incomplete charge transfer at high frequencies. The design has been based on the Al2O3-SiO2insulated gate FET technology, including the use of BIGFET´s to supply the output currents required to interface with TTL circuits. The chip is 0.167 inches beam-tip to beam-tip, and the effective area of each bucket-brigade bit is 10.8 square mils using 10µ design rules and oversized cell size to provide wide operating margins. On a few test slices, the operating frequency has been extended from the normal 1 MHz to at least 1.5 MHz by the inclusion of an ion implant to control dynamic drain conductance.
Keywords :
Charge transfer; Circuits; Clocks; Degradation; FETs; Fabrication; Frequency; Insulation; Large scale integration; Shift registers;
Conference_Titel :
Electron Devices Meeting, 1972 International
DOI :
10.1109/IEDM.1972.249284