• DocumentCode
    3553612
  • Title

    Design of micron MOS switching devices

  • Author

    Dennard, R.H. ; Kuhn, L. ; Yu, H.N.

  • Volume
    18
  • fYear
    1972
  • fDate
    1972
  • Firstpage
    168
  • Lastpage
    170
  • Abstract
    Modern photolithographic technology offers the capability of fabricating MOSFET devices of micron dimensions and less. It is by no means obvious that such small devices can be designed with suitable electrical characteristics for LSI switchivg applications. In this talk we will describe short-channel devices ( L_{eff} \\sim 1 µ) designed by scaling down larger devices with desirable electrical characteristics. Lateral and vertical dimensions, doping level, and operating voltages and currents are scaled in a self-consistent fashion. In this way small devices have been fabricated without the usual deleterious effects associated with short channels. The measured characteristics of these short-channel devices and the larger devices from which they were scaled will be compared.
  • Keywords
    Capacitance; Electric variables; Frequency measurement; Large scale integration; MOSFET circuits; Materials science and technology; Pollution measurement; Schottky barriers; Semiconductor impurities; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1972 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1972.249198
  • Filename
    1477207