DocumentCode
3553612
Title
Design of micron MOS switching devices
Author
Dennard, R.H. ; Kuhn, L. ; Yu, H.N.
Volume
18
fYear
1972
fDate
1972
Firstpage
168
Lastpage
170
Abstract
Modern photolithographic technology offers the capability of fabricating MOSFET devices of micron dimensions and less. It is by no means obvious that such small devices can be designed with suitable electrical characteristics for LSI switchivg applications. In this talk we will describe short-channel devices (
µ) designed by scaling down larger devices with desirable electrical characteristics. Lateral and vertical dimensions, doping level, and operating voltages and currents are scaled in a self-consistent fashion. In this way small devices have been fabricated without the usual deleterious effects associated with short channels. The measured characteristics of these short-channel devices and the larger devices from which they were scaled will be compared.
µ) designed by scaling down larger devices with desirable electrical characteristics. Lateral and vertical dimensions, doping level, and operating voltages and currents are scaled in a self-consistent fashion. In this way small devices have been fabricated without the usual deleterious effects associated with short channels. The measured characteristics of these short-channel devices and the larger devices from which they were scaled will be compared.Keywords
Capacitance; Electric variables; Frequency measurement; Large scale integration; MOSFET circuits; Materials science and technology; Pollution measurement; Schottky barriers; Semiconductor impurities; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1972 International
Type
conf
DOI
10.1109/IEDM.1972.249198
Filename
1477207
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