Title :
Analysis and applications of microstrip exponentially tapered lines
Author :
Bailey, W.L. ; Arnold, R.P. ; Zoroglu, D.S.
Abstract :
This paper presents experimental and analytical work on the application of microstrip exponentially tapered lines (METL) to microwave power transistor characterization and evaluation. Previous published work on tapered transmission lines has dealt mainly with their properties as filters, or as transitions between uniform lines of differing characteristic impedances. This article treats the METL as a transformer for complex (not only real) loads.
Keywords :
Bandwidth; Cutoff frequency; Impedance; Inductance; Integrated circuit modeling; Limit-cycles; Microstrip; Narrowband; Phototransistors; Temperature;
Conference_Titel :
Electron Devices Meeting, 1972 International
DOI :
10.1109/IEDM.1972.249206
