DocumentCode
355369
Title
Measurement of the second-order susceptibility of GaInP films at 1.5 /spl mu/m
Author
Ueno, Yukiko ; Stegeman, G.I.
fYear
1996
fDate
7-7 June 1996
Firstpage
21
Lastpage
22
Abstract
Nonlinear second order susceptibility materials are attracting new attention for ultrafast all-optical switches based on the second order cascading mechanism. Recent experiments and analysis have shown the potential of cascading to decrease the switching energy down to a practical level. Here we report measurements of the second order susceptibility in GaInP films. The key feature is the difference between the matrices for ordered and disordered GaInP.
Keywords
III-V semiconductors; electro-optical switches; gallium compounds; indium compounds; nonlinear optical susceptibility; nonlinear optics; optical films; semiconductor thin films; GaInP; GaInP films; disordered GaInP; nonlinear second order susceptibility materials; ordered GaInP; second order cascading mechanism; second-order susceptibility measurements; switching energy; ultrafast all-optical switches; Absorption; Conducting materials; Diffraction; Gain measurement; Gallium arsenide; Optimized production technology; Spontaneous emission; Substrates; Switches; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-55752-444-0
Type
conf
Filename
865517
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