DocumentCode :
3553712
Title :
The GaAs dual-gate FET with low noise and wide dynamic range
Author :
Asai, Shojiro ; Murai, Furnio ; Kodera, Hiroshi
Author_Institution :
Hitachi, Ltd., Kokubunji, Tokyo, Japan
Volume :
19
fYear :
1973
fDate :
1973
Firstpage :
64
Lastpage :
67
Abstract :
The benefits inherent in the tetrode structure and the potential of GaAs as the material are combined to realize a dual-gate FET with a low noise figure and a wide dynamic range at microwave frequencies. Following the newly constructed design theory of GaAs dual-gate FET, an improved device structure is derived and FET´s are fabricated using a Schottky barrier for the gate. The improved device exhibited a noise figure as low as 3dB and a power gain of 12dB at 4GHz. The stability factor and maximum stable gain are much larger than the single gate unit. By varying the 2nd gate bias, the power gain was controllable over a wide range of 30dB at 4GHz without significantly affecting the input impedance.
Keywords :
Dynamic range; Gain measurement; Gallium arsenide; Laboratories; Microwave FETs; Microwave frequencies; Noise figure; Packaging; Schottky barriers; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1973 International
Type :
conf
DOI :
10.1109/IEDM.1973.188649
Filename :
1477526
Link To Document :
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