Title :
Identification and characterization of excess noise sources in ICS by correlation analysis
Author :
Conti, M. ; Corda, G. ; Conti, Marco ; Corda, G.
Author_Institution :
SGS-ATES, Milano
Abstract :
Correlation measurement of voltage noise present at input, output and other terminals of a linear IC makes possible the identification of the noisy components in spite of the circuit complexity. Structural defects responsible for noise have been identified both in the case of high 1/f noise and of burst noise. The role of stacking faults, dislocation loops and slip line dislocations in
Keywords :
Circuit noise; Equivalent circuits; Feedback circuits; Integrated circuit noise; Low-frequency noise; Noise generators; Noise level; Noise measurement; Signal to noise ratio; Voltage;
Conference_Titel :
Electron Devices Meeting, 1973 International
DOI :
10.1109/IEDM.1973.188699
