DocumentCode
3553806
Title
Characterization of bipolar devices
Author
Ruch, J.G. ; Scharfetter, D.L.
Author_Institution
Bell Laboratories, Murray Hill, N. J.
Volume
19
fYear
1973
fDate
1973
Firstpage
377
Lastpage
380
Abstract
Transistor simulators, computer programs which calculate device characteristics as determined by materials properties and impurity profiles, can be employed directly in the performance evaluation of circuit designs. To be practical, two-dimensional effects must be included while simulation costs must not be prohibitive. The program TRANSIM (TRANsistor SIMulator), described in this paper, employs a highly efficient algorithm specialized for bipolar transistor simulation, which reduces simulation costs for one-dimensional analysis by an order of magnitude over previously published approaches. Two-dimensional effects are approximated without the complexity of a full two-dimensional analysis.
Keywords
Algorithm design and analysis; Analytical models; Bipolar transistors; Circuit simulation; Circuit synthesis; Computational modeling; Computer simulation; Costs; Impurities; Material properties;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1973 International
Type
conf
DOI
10.1109/IEDM.1973.188733
Filename
1477610
Link To Document