• DocumentCode
    3553806
  • Title

    Characterization of bipolar devices

  • Author

    Ruch, J.G. ; Scharfetter, D.L.

  • Author_Institution
    Bell Laboratories, Murray Hill, N. J.
  • Volume
    19
  • fYear
    1973
  • fDate
    1973
  • Firstpage
    377
  • Lastpage
    380
  • Abstract
    Transistor simulators, computer programs which calculate device characteristics as determined by materials properties and impurity profiles, can be employed directly in the performance evaluation of circuit designs. To be practical, two-dimensional effects must be included while simulation costs must not be prohibitive. The program TRANSIM (TRANsistor SIMulator), described in this paper, employs a highly efficient algorithm specialized for bipolar transistor simulation, which reduces simulation costs for one-dimensional analysis by an order of magnitude over previously published approaches. Two-dimensional effects are approximated without the complexity of a full two-dimensional analysis.
  • Keywords
    Algorithm design and analysis; Analytical models; Bipolar transistors; Circuit simulation; Circuit synthesis; Computational modeling; Computer simulation; Costs; Impurities; Material properties;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1973 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1973.188733
  • Filename
    1477610