• DocumentCode
    3553820
  • Title

    Development of a thinned, backside-illuminated charge-coupled device imager

  • Author

    Shortes, S.R. ; Chan, W.W. ; Rhines, W.C. ; Barton, J.B. ; Collins, D.R.

  • Author_Institution
    Texas Instruments Incorporated, Dallas, Texas
  • Volume
    19
  • fYear
    1973
  • fDate
    1973
  • Firstpage
    415
  • Lastpage
    415
  • Keywords
    Charge coupled devices; Charge measurement; Coatings; Current measurement; Dielectrics and electrical insulation; Fabrication; Image resolution; Instruments; Metallization; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1973 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1973.188746
  • Filename
    1477623