Title :
New self-scanned structures: resistive-MOS-gated diode arrays
Author :
Whelan, M V ; Daverveld, L.A.
Author_Institution :
Philips Research Laboratories, Eindhoven, Netherlands
Keywords :
Collision mitigation; Contact resistance; Diodes; Electrodes; Frequency; Insulation; Laboratories; Oscilloscopes; Silicon; Threshold voltage;
Conference_Titel :
Electron Devices Meeting, 1973 International
DOI :
10.1109/IEDM.1973.188747
