• DocumentCode
    3553841
  • Title

    Characterization of GaAs Schottky-read IMPATT diodes

  • Author

    Tserng, H.Q. ; Wisseman, W.R. ; Hasty, T.E.

  • Author_Institution
    Texas Instruments, Incorporated, Dallas, Texas
  • Volume
    19
  • fYear
    1973
  • fDate
    1973
  • Firstpage
    483
  • Lastpage
    485
  • Abstract
    In a recent paper, the oscillator performance of GaAs Schottky-Read diodes of the type metal - n1n2n+was given (4). Efficiencies as high as 26% were observed at X-band for a ratio n1/n2≈ 25. The tuning characteristics of these diodes differ considerably from conventional IMPATTS which have uniform doping profiles. In addition, the Schottky-Read diodes have proved to be difficult to use in microstrip amplifier circuits, particularly at high rf input levels. Small and large signal admittance measurements were made at frequencies from 4 to 12 GHz for different dc current levels on a number of diodes with differing profiles, I-V characteristics, and oscillator performance. The results were compared with those obtained for conventional IMPATTS. In addition, the effect of structural variations on breakdown voltage and depletion depth were calculated.
  • Keywords
    Admittance measurement; Circuit optimization; Doping profiles; Frequency; Gallium arsenide; Microstrip components; Oscillators; Radiofrequency amplifiers; Schottky diodes; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1973 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1973.188765
  • Filename
    1477642