DocumentCode
3553841
Title
Characterization of GaAs Schottky-read IMPATT diodes
Author
Tserng, H.Q. ; Wisseman, W.R. ; Hasty, T.E.
Author_Institution
Texas Instruments, Incorporated, Dallas, Texas
Volume
19
fYear
1973
fDate
1973
Firstpage
483
Lastpage
485
Abstract
In a recent paper, the oscillator performance of GaAs Schottky-Read diodes of the type metal - n1 n2 n+was given (4). Efficiencies as high as 26% were observed at X-band for a ratio n1 /n2 ≈ 25. The tuning characteristics of these diodes differ considerably from conventional IMPATTS which have uniform doping profiles. In addition, the Schottky-Read diodes have proved to be difficult to use in microstrip amplifier circuits, particularly at high rf input levels. Small and large signal admittance measurements were made at frequencies from 4 to 12 GHz for different dc current levels on a number of diodes with differing profiles, I-V characteristics, and oscillator performance. The results were compared with those obtained for conventional IMPATTS. In addition, the effect of structural variations on breakdown voltage and depletion depth were calculated.
Keywords
Admittance measurement; Circuit optimization; Doping profiles; Frequency; Gallium arsenide; Microstrip components; Oscillators; Radiofrequency amplifiers; Schottky diodes; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1973 International
Type
conf
DOI
10.1109/IEDM.1973.188765
Filename
1477642
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