DocumentCode :
3554004
Title :
Gigabit rate Gunn-effect shift register
Author :
Yanagisawa, S. ; Wada, O. ; Takanashi, H.
Author_Institution :
Fujitsu Laboratories Ltd., Kawasaki, Japan
Volume :
21
fYear :
1975
fDate :
1975
Firstpage :
317
Lastpage :
319
Abstract :
In this paper, the practical circuit configuration of the dynamic shift register utilizing the Gunn domain is proposed and in order to demonstrate its utility, two stage shift register with the clock rate of 1.6 GHz was fabricated as a monolithically integrated circuit on an epitaxial GaAs. The improved fabrication technique was used to obtain the experimental circuit. The successful operation was confirmed under DC biased condition.
Keywords :
Circuits; Clocks; Doping; Etching; Fabrication; Gunn devices; Resistors; Shift registers; Substrates; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1975 International
Type :
conf
DOI :
10.1109/IEDM.1975.188888
Filename :
1478249
Link To Document :
بازگشت