Title : 
Multilevel random access memory using one JFET per cell
         
        
            Author : 
Heald, A. Raymond ; Hodges, A. David
         
        
            Author_Institution : 
University of Washington, Seattle, Wash.
         
        
        
        
        
        
        
            Abstract : 
A memory cell capable of storing multilevel or analog information and providing random-access operation with nondestructive readout has been studied. It used a single junction field-effect transistor as the storage cell. Experimental and analytical studies suggest that eight or sixteen level operation should be feasible with refresh operations every 0.1 to 1 second; cell area can be under 2 mil2.
         
        
            Keywords : 
DRAM chips; FETs; Leakage current; MOSFETs; Optical arrays; Random access memory; Read-write memory; Signal design; Surface discharges; Voltage;
         
        
        
        
            Conference_Titel : 
Electron Devices Meeting, 1975 International
         
        
        
            DOI : 
10.1109/IEDM.1975.188890