• DocumentCode
    3554035
  • Title

    Borsenic bipolar process

  • Author

    Saraswat, Krishna C. ; Meindl, James D.

  • Author_Institution
    Stanford University, Stanford, California
  • Volume
    21
  • fYear
    1975
  • fDate
    1975
  • Firstpage
    437
  • Lastpage
    439
  • Abstract
    A new process utilizing simultaneous diffusion of Boron and Arsenic (Borsenic) from doped oxide, to fabricate high performance bipolar transistors has been developed. The doped oxide is deposited at low temperature by oxidation of SiH4, B2H6and AsH3. Since As diffuses much slower than B in Si, by heating the doped oxide at high temperatures n+-p-n structures have been obtained. By varying the time and temperature of diffusion or by varying As or B content in the oxide, we have fabricated from extremely shallow (e.g. X_{EB} \\simeq 0.3 \\\\mu, W_{BASE} = 0.15\\\\mu ) to fairly deep (e.g X_{EB} \\simeq 2\\\\mu, W_{BASE} = 0.4\\\\mu ) bipolar transistors. Details of the fabrication process and properties of the transistors are presented here.
  • Keywords
    Bipolar transistors; Boron; Diffusion processes; Epitaxial layers; Etching; Fabrication; Heating; Inductors; Oxidation; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1975 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1975.188916
  • Filename
    1478277