DocumentCode
3554035
Title
Borsenic bipolar process
Author
Saraswat, Krishna C. ; Meindl, James D.
Author_Institution
Stanford University, Stanford, California
Volume
21
fYear
1975
fDate
1975
Firstpage
437
Lastpage
439
Abstract
A new process utilizing simultaneous diffusion of Boron and Arsenic (Borsenic) from doped oxide, to fabricate high performance bipolar transistors has been developed. The doped oxide is deposited at low temperature by oxidation of SiH4 , B2 H6 and AsH3 . Since As diffuses much slower than B in Si, by heating the doped oxide at high temperatures n+-p-n structures have been obtained. By varying the time and temperature of diffusion or by varying As or B content in the oxide, we have fabricated from extremely shallow (e.g.
) to fairly deep (e.g
) bipolar transistors. Details of the fabrication process and properties of the transistors are presented here.
) to fairly deep (e.g
) bipolar transistors. Details of the fabrication process and properties of the transistors are presented here.Keywords
Bipolar transistors; Boron; Diffusion processes; Epitaxial layers; Etching; Fabrication; Heating; Inductors; Oxidation; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1975 International
Type
conf
DOI
10.1109/IEDM.1975.188916
Filename
1478277
Link To Document