Title :
Assisted scanning tunneling microscopy with visible polarized laser light
Author :
Bragas, A.V. ; Coy, Johannes A. ; Martinez, O.E.
Author_Institution :
Fac. de Ciencias Exactas y Naturales, Buenos Aires Univ., Argentina
Abstract :
Summary form only given. Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. Frequency mixing at the STM junction with infrared radiation, photoassisted spectroscopy in semiconductors materials, and images with atomic resolution of graphite recording rectification signal have been reported. We have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface was illuminated with an He-Ne laser polarized in the s and p directions.
Keywords :
image resolution; infrared spectroscopy; light polarisation; measurement by laser beam; optical frequency conversion; optical microscopy; scanning tunnelling microscopy; He-Ne laser polarisation; STM junction; assisted scanning tunneling microscopy; atomic resolution; frequency mixing; graphite recording rectification signal; highly oriented pyrolytic graphite; infrared radiation; laser-assisted scanning tunneling microscopy; photoassisted spectroscopy; semiconductors materials; tip-sample interface; tungsten ti; visible polarized laser light; Atom lasers; Atomic beams; Atomic measurements; Frequency; Infrared spectra; Microscopy; Optical polarization; Semiconductor lasers; Surface emitting lasers; Tunneling;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-444-0
