DocumentCode
3554132
Title
Junction modeling for solar cells - Theory and experiment
Author
Lindholm, F.A. ; Neugroschel, A. ; Sah, C.T.
Author_Institution
University of Florida, Gainesville, Florida
fYear
1976
fDate
6-8 Dec. 1976
Firstpage
61
Lastpage
64
Abstract
This paper describes methods that enable us to experimentally determine the recombination lifetimes in the emitter and base of a p-n-junction solar cell and the energy-gap shrinkage in the emitter for the first time. The methods integrate experiment with theory such that the quantitative analysis of the measurements is rigorously based on the underlying device physics.
Keywords
Diodes; Electric variables; Electric variables measurement; NASA; P-n junctions; Photovoltaic cells; Physics; Semiconductor process modeling; Silicon; Solar energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1976 International
Conference_Location
Washigton, DC, USA
Type
conf
DOI
10.1109/IEDM.1976.188985
Filename
1478697
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