DocumentCode :
3554169
Title :
A new photomask with ion-implanted resist
Author :
Hashimoto, Toshikazu ; Koguchi, Toshio ; Okuyama, Yasushi ; Yamamoto, Kyoji ; Takahata, Koichiro ; Kamoshida, Mototaka ; Yanagawa, Takayuki
Author_Institution :
IC Division Nippon Electric Co., Ltd., Kawasaki, Japan
Volume :
22
fYear :
1976
fDate :
1976
Firstpage :
198
Lastpage :
201
Abstract :
A novel photomask fabrication method using ion implantation has been developed, where energetic ions are implanted into the patterned resist on a glass substrate. The optical transmission of the resist film was exceedingly decreased and the resist becomes more mechanically and chemically resistant by high energy, high dose ion implantation. These results are suitably applied to photomask fabrication. In this paper process conditions such as types of resist, resist thickness, ion species, energy and dose will be discussed. And some of the evaluation results on the implanted photomasks will be also discussed in relation to optical density, pattern definition, scratch resistance and chemical attacks.
Keywords :
Acceleration; Chemicals; Glass; Ion implantation; Optical device fabrication; Optical films; Particle beam optics; Resistance; Resists; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1976 International
Type :
conf
DOI :
10.1109/IEDM.1976.189018
Filename :
1478730
Link To Document :
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