DocumentCode
3554169
Title
A new photomask with ion-implanted resist
Author
Hashimoto, Toshikazu ; Koguchi, Toshio ; Okuyama, Yasushi ; Yamamoto, Kyoji ; Takahata, Koichiro ; Kamoshida, Mototaka ; Yanagawa, Takayuki
Author_Institution
IC Division Nippon Electric Co., Ltd., Kawasaki, Japan
Volume
22
fYear
1976
fDate
1976
Firstpage
198
Lastpage
201
Abstract
A novel photomask fabrication method using ion implantation has been developed, where energetic ions are implanted into the patterned resist on a glass substrate. The optical transmission of the resist film was exceedingly decreased and the resist becomes more mechanically and chemically resistant by high energy, high dose ion implantation. These results are suitably applied to photomask fabrication. In this paper process conditions such as types of resist, resist thickness, ion species, energy and dose will be discussed. And some of the evaluation results on the implanted photomasks will be also discussed in relation to optical density, pattern definition, scratch resistance and chemical attacks.
Keywords
Acceleration; Chemicals; Glass; Ion implantation; Optical device fabrication; Optical films; Particle beam optics; Resistance; Resists; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1976 International
Type
conf
DOI
10.1109/IEDM.1976.189018
Filename
1478730
Link To Document