• DocumentCode
    3554169
  • Title

    A new photomask with ion-implanted resist

  • Author

    Hashimoto, Toshikazu ; Koguchi, Toshio ; Okuyama, Yasushi ; Yamamoto, Kyoji ; Takahata, Koichiro ; Kamoshida, Mototaka ; Yanagawa, Takayuki

  • Author_Institution
    IC Division Nippon Electric Co., Ltd., Kawasaki, Japan
  • Volume
    22
  • fYear
    1976
  • fDate
    1976
  • Firstpage
    198
  • Lastpage
    201
  • Abstract
    A novel photomask fabrication method using ion implantation has been developed, where energetic ions are implanted into the patterned resist on a glass substrate. The optical transmission of the resist film was exceedingly decreased and the resist becomes more mechanically and chemically resistant by high energy, high dose ion implantation. These results are suitably applied to photomask fabrication. In this paper process conditions such as types of resist, resist thickness, ion species, energy and dose will be discussed. And some of the evaluation results on the implanted photomasks will be also discussed in relation to optical density, pattern definition, scratch resistance and chemical attacks.
  • Keywords
    Acceleration; Chemicals; Glass; Ion implantation; Optical device fabrication; Optical films; Particle beam optics; Resistance; Resists; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1976 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1976.189018
  • Filename
    1478730