DocumentCode
3554203
Title
The relative performance and merits of CMOS technologies
Author
Aitken, A. ; MacArthur, A.T.P. ; Abbott, R. ; Morris, J.D.
Author_Institution
Mitel Semiconductors Inc. Bromont, Quebec, Canada
Volume
22
fYear
1976
fDate
1976
Firstpage
327
Lastpage
330
Abstract
Comparisons have been made between silicon gate guardbanded CMOS technology, oxide isolated CMOS and CMOS/SOS. The points of comparison include performance, density and flexibility in layout. The reduction in parasitic capacitance and the elimination of parasitic devices in the last two technologies compared with the guard-banded technology does result in significant advantages. However, only marginal performance improvement of the SOS/CMOS over the oxide isolated CMOS technology is predicted due to effects associated with the SOS material and the floating substrate.
Keywords
CMOS process; CMOS technology; Geometry; Isolation technology; Parasitic capacitance; Propagation delay; Ring oscillators; Silicon; Testing; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1976 International
Type
conf
DOI
10.1109/IEDM.1976.189049
Filename
1478761
Link To Document