• DocumentCode
    3554203
  • Title

    The relative performance and merits of CMOS technologies

  • Author

    Aitken, A. ; MacArthur, A.T.P. ; Abbott, R. ; Morris, J.D.

  • Author_Institution
    Mitel Semiconductors Inc. Bromont, Quebec, Canada
  • Volume
    22
  • fYear
    1976
  • fDate
    1976
  • Firstpage
    327
  • Lastpage
    330
  • Abstract
    Comparisons have been made between silicon gate guardbanded CMOS technology, oxide isolated CMOS and CMOS/SOS. The points of comparison include performance, density and flexibility in layout. The reduction in parasitic capacitance and the elimination of parasitic devices in the last two technologies compared with the guard-banded technology does result in significant advantages. However, only marginal performance improvement of the SOS/CMOS over the oxide isolated CMOS technology is predicted due to effects associated with the SOS material and the floating substrate.
  • Keywords
    CMOS process; CMOS technology; Geometry; Isolation technology; Parasitic capacitance; Propagation delay; Ring oscillators; Silicon; Testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1976 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1976.189049
  • Filename
    1478761