DocumentCode :
3554203
Title :
The relative performance and merits of CMOS technologies
Author :
Aitken, A. ; MacArthur, A.T.P. ; Abbott, R. ; Morris, J.D.
Author_Institution :
Mitel Semiconductors Inc. Bromont, Quebec, Canada
Volume :
22
fYear :
1976
fDate :
1976
Firstpage :
327
Lastpage :
330
Abstract :
Comparisons have been made between silicon gate guardbanded CMOS technology, oxide isolated CMOS and CMOS/SOS. The points of comparison include performance, density and flexibility in layout. The reduction in parasitic capacitance and the elimination of parasitic devices in the last two technologies compared with the guard-banded technology does result in significant advantages. However, only marginal performance improvement of the SOS/CMOS over the oxide isolated CMOS technology is predicted due to effects associated with the SOS material and the floating substrate.
Keywords :
CMOS process; CMOS technology; Geometry; Isolation technology; Parasitic capacitance; Propagation delay; Ring oscillators; Silicon; Testing; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1976 International
Type :
conf
DOI :
10.1109/IEDM.1976.189049
Filename :
1478761
Link To Document :
بازگشت