• DocumentCode
    3554480
  • Title

    Evaluation and design optimization of piezoresistive gauge factor of thick-film resistors

  • Author

    Song, C. ; Kerns, D.V., Jr. ; Davidson, J.L. ; Kang, W. ; Kerns, S.

  • Author_Institution
    Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
  • fYear
    1991
  • fDate
    7-10 Apr 1991
  • Firstpage
    1106
  • Abstract
    On the basis of the analysis of all the thick-film design methodologies, the authors designed a test sample on which four different length-over-width ratios of resistors were designed. They found that the length-over-width ratio will substantially affect the gauge factor in some cases, in contrast to prior research. This can be modeled to generate a linear predictive model, The sensors designed on the insulator and the sensors underneath the insulator were also studied in order to simulate the multilayer hybrid technology and study the effects of insulator-resistor-substrate surface interaction. It is demonstrated that design techniques can affect the strain sensitivity of thick-film resistors
  • Keywords
    piezoresistance; strain gauges; thick film resistors; design optimization; insulator-resistor-substrate surface interaction; length-over-width ratios; linear predictive model; multilayer hybrid technology; piezoresistive gauge factor; sensors; strain sensitivity; test sample; thick-film resistors; Capacitive sensors; Design methodology; Design optimization; Hybrid power systems; Insulation; Nonhomogeneous media; Piezoresistance; Predictive models; Resistors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon '91., IEEE Proceedings of
  • Conference_Location
    Williamsburg, VA
  • Print_ISBN
    0-7803-0033-5
  • Type

    conf

  • DOI
    10.1109/SECON.1991.147935
  • Filename
    147935