DocumentCode
3554480
Title
Evaluation and design optimization of piezoresistive gauge factor of thick-film resistors
Author
Song, C. ; Kerns, D.V., Jr. ; Davidson, J.L. ; Kang, W. ; Kerns, S.
Author_Institution
Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
fYear
1991
fDate
7-10 Apr 1991
Firstpage
1106
Abstract
On the basis of the analysis of all the thick-film design methodologies, the authors designed a test sample on which four different length-over-width ratios of resistors were designed. They found that the length-over-width ratio will substantially affect the gauge factor in some cases, in contrast to prior research. This can be modeled to generate a linear predictive model, The sensors designed on the insulator and the sensors underneath the insulator were also studied in order to simulate the multilayer hybrid technology and study the effects of insulator-resistor-substrate surface interaction. It is demonstrated that design techniques can affect the strain sensitivity of thick-film resistors
Keywords
piezoresistance; strain gauges; thick film resistors; design optimization; insulator-resistor-substrate surface interaction; length-over-width ratios; linear predictive model; multilayer hybrid technology; piezoresistive gauge factor; sensors; strain sensitivity; test sample; thick-film resistors; Capacitive sensors; Design methodology; Design optimization; Hybrid power systems; Insulation; Nonhomogeneous media; Piezoresistance; Predictive models; Resistors; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '91., IEEE Proceedings of
Conference_Location
Williamsburg, VA
Print_ISBN
0-7803-0033-5
Type
conf
DOI
10.1109/SECON.1991.147935
Filename
147935
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