DocumentCode :
3554486
Title :
A complementary-pair of high-power MOSFET´s
Author :
Okabe, Takeaki ; Yoshida, Isao ; Ochi, Shikayuki ; Nagata, Minoru
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Volume :
23
fYear :
1977
fDate :
1977
Firstpage :
416
Lastpage :
419
Abstract :
A complementary pair of high power MOSFETs is developed, each of which has a drain breakdown voltage as high as 200V and 10A current capabilities. This device has an offset gate and an ion-implanted additional channel to realize this high breakdown voltage. The device structure including the use of a field plate, is optimized by two dimensional MOS analysis. This design and a highly refined polysilicon gate fabrication process contribute to the realization of the high power devices. Measurement of these devices reveals superior thermal characteristic and assures a larger ASO than that of conventional bipolar transistors of the same chip size.
Keywords :
Bipolar transistors; Breakdown voltage; Electric resistance; Fabrication; Laboratories; MOSFETs; Power transistors; Semiconductor device measurement; Silicon; Size measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1977 International
Type :
conf
DOI :
10.1109/IEDM.1977.189275
Filename :
1479355
Link To Document :
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