DocumentCode :
3554614
Title :
Moisture determination in hermetic IC packages by the dew point method using AC capacitance and conductance measurement
Author :
Sosniak, J. ; Unger, B.A.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
Volume :
24
fYear :
1978
fDate :
1978
Firstpage :
104
Lastpage :
107
Abstract :
The dew point in ceramic packages is shown to be observable by ac phase-sensitive measurement of the real and imaginary parts of the dielectric constant of an air gap capacitor. Only the package surface directly under the sensor is cooled, enhancing the sensitivity by preferential condensation. The dew point response peak is followed by a sharp drop due to interface freezing phenomena. Milligrams of liquid water had to be placed in the packages before sealing with epoxy at 175°C for dew points above -20°C to been seen. Large amounts of water were thus eliminated even at this moderate temperature.
Keywords :
Capacitance measurement; Capacitors; Ceramics; Dielectric constant; Dielectric measurements; Integrated circuit packaging; Moisture measurement; Phase measurement; Sensor phenomena and characterization; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1978 International
Type :
conf
DOI :
10.1109/IEDM.1978.189363
Filename :
1479788
Link To Document :
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