• DocumentCode
    3554624
  • Title

    Drain current limitations and temperature effects in GaAs MESFETs

  • Author

    Fukui, H.

  • Author_Institution
    Bell Laboratories, Murray Hill, New Jersey
  • Volume
    24
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    140
  • Lastpage
    143
  • Abstract
    The maximum drain current and the corresponding knee voltage that play an important role in determining the maximum power handling capability of a GaAs MESFET are defined in a practical manner. Simple and yet accurate enough expressions are derived for them in terms of device geometrical and material parameters. The relationship between the maximum and zero-gate-bias drain currents is also presented. Theoretical values of dc parameters are in excellent agreement with their measured values. Important findings on the temperature dependence of these parameters are also shown.
  • Keywords
    Conducting materials; Electrons; FETs; Gallium arsenide; Knee; Leakage current; MESFETs; Temperature dependence; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1978 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1978.189372
  • Filename
    1479797