DocumentCode :
3554624
Title :
Drain current limitations and temperature effects in GaAs MESFETs
Author :
Fukui, H.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
Volume :
24
fYear :
1978
fDate :
1978
Firstpage :
140
Lastpage :
143
Abstract :
The maximum drain current and the corresponding knee voltage that play an important role in determining the maximum power handling capability of a GaAs MESFET are defined in a practical manner. Simple and yet accurate enough expressions are derived for them in terms of device geometrical and material parameters. The relationship between the maximum and zero-gate-bias drain currents is also presented. Theoretical values of dc parameters are in excellent agreement with their measured values. Important findings on the temperature dependence of these parameters are also shown.
Keywords :
Conducting materials; Electrons; FETs; Gallium arsenide; Knee; Leakage current; MESFETs; Temperature dependence; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1978 International
Type :
conf
DOI :
10.1109/IEDM.1978.189372
Filename :
1479797
Link To Document :
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