DocumentCode
3554624
Title
Drain current limitations and temperature effects in GaAs MESFETs
Author
Fukui, H.
Author_Institution
Bell Laboratories, Murray Hill, New Jersey
Volume
24
fYear
1978
fDate
1978
Firstpage
140
Lastpage
143
Abstract
The maximum drain current and the corresponding knee voltage that play an important role in determining the maximum power handling capability of a GaAs MESFET are defined in a practical manner. Simple and yet accurate enough expressions are derived for them in terms of device geometrical and material parameters. The relationship between the maximum and zero-gate-bias drain currents is also presented. Theoretical values of dc parameters are in excellent agreement with their measured values. Important findings on the temperature dependence of these parameters are also shown.
Keywords
Conducting materials; Electrons; FETs; Gallium arsenide; Knee; Leakage current; MESFETs; Temperature dependence; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189372
Filename
1479797
Link To Document