Title :
Injection efficiency in bipolar devices
Author_Institution :
University of Waterloo, Waterloo, Ontario, Canada
Abstract :
The influence of impurity deionisation in the emitter of a bipolar device is examined. It is shown that most of the effects usually attributed to band-gap narrowing, can be adequately explained by an unperturbed band (impurity model).
Keywords :
Current measurement; Electrostatics; Gain measurement; Impurities; Integral equations; Photonic band gap; Reflection; Statistics; Tail; Testing;
Conference_Titel :
Electron Devices Meeting, 1978 International
DOI :
10.1109/IEDM.1978.189415
