DocumentCode
3554712
Title
Arsenic emitter effects
Author
Wieder, Armin W.
Author_Institution
Institut f. Theoretische Elektrotechnik, TH-Aachen, Germany
Volume
24
fYear
1978
fDate
1978
Firstpage
460
Lastpage
462
Abstract
Recombination mechanisms and bandgap narrowing effects have proven to affect device performance significantly. The trend to minimum size devices stresses the significance of these effects even more so. Nevertheless bandgap narrowing effects have only been measured at devices for boron and not yet for n-type material. These effects, however, are of most interest in the heavily doped regions of emitters and subcollectors.
Keywords
Absorption; Bipolar transistors; Boron; Impurities; Mechanical factors; Photonic band gap; Process control; Silicon; Stress; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189454
Filename
1479879
Link To Document