• DocumentCode
    3554712
  • Title

    Arsenic emitter effects

  • Author

    Wieder, Armin W.

  • Author_Institution
    Institut f. Theoretische Elektrotechnik, TH-Aachen, Germany
  • Volume
    24
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    460
  • Lastpage
    462
  • Abstract
    Recombination mechanisms and bandgap narrowing effects have proven to affect device performance significantly. The trend to minimum size devices stresses the significance of these effects even more so. Nevertheless bandgap narrowing effects have only been measured at devices for boron and not yet for n-type material. These effects, however, are of most interest in the heavily doped regions of emitters and subcollectors.
  • Keywords
    Absorption; Bipolar transistors; Boron; Impurities; Mechanical factors; Photonic band gap; Process control; Silicon; Stress; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1978 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1978.189454
  • Filename
    1479879