DocumentCode
3554741
Title
The surge capability of high voltage rectifiers
Author
Kao, Y.C. ; Hower, P.L.
Author_Institution
Westinghouse R&D Center, Pittsburgh, PA
Volume
24
fYear
1978
fDate
1978
Firstpage
568
Lastpage
574
Abstract
The failure mode under forward surge current conditions is investigated from theoretical and experimental viewpoints. The hypothesis that current filamentation occurs when the intrinsic carrier concentration becomes comparable to the injected concentration is confirmed by experimental measurements on rectifiers. The device junction temperature is deduced from separate measurements of the forward voltage drop, under pulsed conditions, as a function of case temperature and current. The measured time-dependence of junction temperature is in good agreement with the predictions of a simple one-dimensional heat flow model.
Keywords
Circuit testing; Current measurement; Electrical resistance measurement; Heating; Packaging; Pulse measurements; Rectifiers; Surges; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189480
Filename
1479905
Link To Document