Title :
Spectral density of noise in CCDs
Author :
Klar, H. ; Feil, M. ; Pfleiderer, H.J.
Author_Institution :
Siemens AG, Munich, W. Germany
Abstract :
Good agreement between theory and measurements is obtained for the spectral density of transfer noise which is the dominant noise source in a SCCD. Within a frequencyband small compared to the baseband of the CCD the achievable signal-to-noise ratio S/N is limited by the noise power in that small frequency range and not by the mean square value. Our considerations show that the spectral density of noise power of a CCD is inverse proportional to the clock frequency fC. Therefore increasing fCimproves the S/N-ratio and enhances the performance of the CCD in band-limited analog communication systems.
Keywords :
Baseband; Charge coupled devices; Clocks; Computer interfaces; Electrodes; Fluctuations; Frequency; Interface states; Noise shaping; Signal to noise ratio;
Conference_Titel :
Electron Devices Meeting, 1978 International
DOI :
10.1109/IEDM.1978.189489