Title :
Integrated injection logic with extended temperature range capability
Author :
Dening, David C. ; Ragonese, Louis J. ; Lee, Stephen C Y
Author_Institution :
General Electric Company, Syracuse, New York
Abstract :
Silicon I2L devices were designed, fabricated and analyzed. These devices were shown to be fully operational from -55°C to +300°C.
Keywords :
Circuits; Conductivity; Immunity testing; Laboratories; Leakage current; Logic devices; Semiconductor device doping; Semiconductor process modeling; Silicon; Temperature distribution;
Conference_Titel :
Electron Devices Meeting, 1979 Internationa
DOI :
10.1109/IEDM.1979.189576
