DocumentCode
3554888
Title
Crystalline silicon on insulators by graphoepitaxy
Author
Geis, M.W. ; Flanders, D.C. ; Antoniadis, D.A. ; Smith, Henry I.
Author_Institution
Massachusetts Institute of Technology, Lexington, Massachusetts
Volume
25
fYear
1979
fDate
1979
Firstpage
210
Lastpage
212
Abstract
Graphoepitaxy is a new technique that uses artificial surface relief structures to induce crystallographic orientation in thin films. A simple model for graphoepitaxy is presented which predicts that materials that can be deposited on smooth amorphous substrates to produce a crystalline texture can be uniformly oriented by appropriate surface relief structures. Recently, graphoepitaxy has been used to achieve uniformly oriented silicon films 0.5 µm thick over surface relief gratings etched into amorphous fused silica substrates. The silicon was first deposited as an amorphous film and then crystallized using a scanned Ar laser beam. The mean [100] directions in the silicon were parallel to the grating and perpendicular to the substrate plane. Films uniformly doped with phosphorous (2.4 × 1017atoms/cm3) had an electron mobility at least 40% of the bulk value.
Keywords
Amorphous materials; Crystalline materials; Crystallization; Crystallography; Gratings; Predictive models; Semiconductor films; Silicon on insulator technology; Substrates; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1979 Internationa
Type
conf
DOI
10.1109/IEDM.1979.189581
Filename
1480446
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