DocumentCode :
3554888
Title :
Crystalline silicon on insulators by graphoepitaxy
Author :
Geis, M.W. ; Flanders, D.C. ; Antoniadis, D.A. ; Smith, Henry I.
Author_Institution :
Massachusetts Institute of Technology, Lexington, Massachusetts
Volume :
25
fYear :
1979
fDate :
1979
Firstpage :
210
Lastpage :
212
Abstract :
Graphoepitaxy is a new technique that uses artificial surface relief structures to induce crystallographic orientation in thin films. A simple model for graphoepitaxy is presented which predicts that materials that can be deposited on smooth amorphous substrates to produce a crystalline texture can be uniformly oriented by appropriate surface relief structures. Recently, graphoepitaxy has been used to achieve uniformly oriented silicon films 0.5 µm thick over surface relief gratings etched into amorphous fused silica substrates. The silicon was first deposited as an amorphous film and then crystallized using a scanned Ar laser beam. The mean [100] directions in the silicon were parallel to the grating and perpendicular to the substrate plane. Films uniformly doped with phosphorous (2.4 × 1017atoms/cm3) had an electron mobility at least 40% of the bulk value.
Keywords :
Amorphous materials; Crystalline materials; Crystallization; Crystallography; Gratings; Predictive models; Semiconductor films; Silicon on insulator technology; Substrates; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1979 Internationa
Type :
conf
DOI :
10.1109/IEDM.1979.189581
Filename :
1480446
Link To Document :
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