DocumentCode :
3554984
Title :
Optimization, performance and limitations of monolithic polycrystalline silicon distributed RC devices
Author :
Gerzberg, Levy ; Meindl, James D.
Author_Institution :
Stanford University, Stanford, California
Volume :
25
fYear :
1979
fDate :
1979
Firstpage :
502
Lastpage :
505
Abstract :
New monolithic distributed resistor-capacitor structures (DRCs) for the realization of unique high-performance integrated filters have been characterized, optimized, and realized. These devices are implemented in polycrystalline silicon utilizing its unique properties such as high resistivity and linearity, controllable temperature sensitivity, associated distributed capacitance, and complete compatibility with both BJT and MOST fabrication processes. Parameters affecting thee properties have been studied, characterized, and used for the optimization and limitation analysis of the distributed devices. Highly-reproducible monolithic constant phase-shift filters have been fabricated simultaneously with bipolar devices resulting a frequency response accurate to within 0.04 dB over a range of 100 Hz to 40 kHz. A lumped realization of such filters would require at least 20 components with a matching better than 0.5% and more than five times increase in chip area.
Keywords :
Capacitance; Conductivity; Dielectric substrates; Fabrication; Laboratories; Linearity; Matched filters; Resistors; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1979 Internationa
Type :
conf
DOI :
10.1109/IEDM.1979.189668
Filename :
1480533
Link To Document :
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