Title :
Single-chip FM-CW radar low-cost production test
Author :
Reynolds, L.D. ; Wang, M.S.
Author_Institution :
Hittite Microwave Corp., Woburn, MA, USA
Abstract :
In order to realize the low product cost potential of a single-chip FM-CW radar MMIC (monolithic microwave integrated circuit), an innovative production testing concept is developed in which the complete transmit/receive transfer function is verified in under one minute using the self-generated microwave signal in a simulated radar range environment. The test acceptance criteria are related to fundamental radar module specifications. The test environment, test acceptance criteria, and data storage are controlled by a personal computer. A text example is given.<>
Keywords :
MMIC; automatic test equipment; automatic testing; frequency modulation; integrated circuit testing; production testing; radar equipment; ATE; FM-CW radar; MMIC; low-cost production test; microcomputer control; monolithic microwave integrated circuit; personal computer; self-generated microwave signal; simulated radar range environment; single-chip; transmit/receive transfer function; Automatic testing; Circuit testing; Cost function; Integrated circuit testing; MMICs; Microwave integrated circuits; Monolithic integrated circuits; Production; Radar; Transfer functions;
Conference_Titel :
Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1991. Digest of Papers, IEEE 1991
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-0087-4
DOI :
10.1109/MCS.1991.148075
