DocumentCode
3555120
Title
Development of a poly-gate NMOS process for research and teaching
Author
Langford, D. Scott ; Rambo, Keith J. ; Fox, Robert M. ; Back, Thomas ; Paneda, Carlos
Author_Institution
Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
fYear
1991
fDate
12-14 Jun 1991
Firstpage
48
Lastpage
53
Abstract
An integrated circuit fabrication facility has been developed at the University of Florida which is suitable for undergraduate laboratories, research in process technology, and studies in DFM (design for manufacturability). The NMOS process described represents the first step toward the long-range goal of developing a CMOS technology. The design goals for the University of Florida NMOS (UF NMOS) process were to check the performance limits of the fabrication facilities and to develop a process flow which could be integrated into a one semester undergraduate laboratory. Processing capabilities include ion implantation and low-pressure chemical vapor deposition (LPCVD) of polysilicon and silicon dioxide. The availability of these processes allows design of an all-implanted technology including threshold-adjustment implants and polysilicon gates with a self-aligned MOS structure. The process description is given. Process design tools and layout tools are described. Testing procedures are outlined, and the laboratory implementation is discussed. Measured data flow from NMOS devices are included
Keywords
MOS integrated circuits; chemical vapour deposition; integrated circuit technology; ion implantation; teaching; CMOS technology; DFM; University of Florida; all-implanted technology; data flow; fabrication facilities; integrated circuit fabrication facility; ion implantation; layout tools; low-pressure chemical vapor deposition; poly-gate NMOS process; polysilicon gates; process flow; research; self-aligned MOS structure; threshold-adjustment implants; undergraduate laboratories; CMOS technology; Chemical technology; Design for manufacture; Education; Fabrication; Integrated circuit manufacture; Integrated circuit technology; Laboratories; MOS devices; Process design;
fLanguage
English
Publisher
ieee
Conference_Titel
University/Government/Industry Microelectronics Symposium, 1991. Proceedings., Ninth Biennial
Conference_Location
Melbourne, FL
ISSN
0749-6877
Print_ISBN
0-7803-0109-9
Type
conf
DOI
10.1109/UGIM.1991.148120
Filename
148120
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