Title :
Elimination of latch up in bulk CMOS
Author :
Payne, R.S. ; Grant, W.N. ; Bertram, W.J.
Author_Institution :
Analog Devices, Wilmington, Mass.
Keywords :
CMOS technology; Charge carrier lifetime; Circuits; Gold; Latches; Microprocessors; Packaging; Semiconductor device measurement; Substrates; Thyristors;
Conference_Titel :
Electron Devices Meeting, 1980 International
DOI :
10.1109/IEDM.1980.189806
