Non-destructive image sensor

New imaging device characterized by non-destructive read-out operation is discussed theoretically concentrating on an optical sensing process and a read-out process. The light information is continuously stored in this imaging device even during the read-out process. It has been demonstrated theoretically that the stored voltage is almost independent of the storage capacitance due to the existence of the floating n⁺p contact and that the read-out voltage is almost independent of the bit line capacitance. The new imaging device has excellent features such as non-destructive characteristic, high sensitivity and wide dynamic range.