Title :
Assessing performance of standard evaluation circuits for radiation hardened 32 bit processor
Author :
Koziarz, Nancy A.
Author_Institution :
CRL/RBRA, Griffiss AFB, NY, USA
Abstract :
Methods of determining contractors´ ability to meet the requirements of the radiation-hardened 32-b processor before actual production are presented. Standard evaluation circuits were examined, and the results used a gauge to evaluate the contractor performance. Using tests such as wafer yield, electrical tests, package screening, and radiation testing, the test chip could be used to judge the final product
Keywords :
integrated circuit testing; microprocessor chips; radiation hardening (electronics); 32 bits; contractor performance; electrical tests; evaluation circuits; microprocessor chips; package screening; radiation hardening; radiation testing; standard evaluation circuits; wafer yield; Capacitors; Circuit testing; Laboratories; Macrocell networks; Packaging; Performance evaluation; Radiation hardening; Read only memory; Ring oscillators; Single event upset;
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 1991. Proceedings., Ninth Biennial
Conference_Location :
Melbourne, FL
Print_ISBN :
0-7803-0109-9
DOI :
10.1109/UGIM.1991.148133
