DocumentCode
3555264
Title
Assessing performance of standard evaluation circuits for radiation hardened 32 bit processor
Author
Koziarz, Nancy A.
Author_Institution
CRL/RBRA, Griffiss AFB, NY, USA
fYear
1991
fDate
12-14 Jun 1991
Firstpage
113
Lastpage
115
Abstract
Methods of determining contractors´ ability to meet the requirements of the radiation-hardened 32-b processor before actual production are presented. Standard evaluation circuits were examined, and the results used a gauge to evaluate the contractor performance. Using tests such as wafer yield, electrical tests, package screening, and radiation testing, the test chip could be used to judge the final product
Keywords
integrated circuit testing; microprocessor chips; radiation hardening (electronics); 32 bits; contractor performance; electrical tests; evaluation circuits; microprocessor chips; package screening; radiation hardening; radiation testing; standard evaluation circuits; wafer yield; Capacitors; Circuit testing; Laboratories; Macrocell networks; Packaging; Performance evaluation; Radiation hardening; Read only memory; Ring oscillators; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
University/Government/Industry Microelectronics Symposium, 1991. Proceedings., Ninth Biennial
Conference_Location
Melbourne, FL
ISSN
0749-6877
Print_ISBN
0-7803-0109-9
Type
conf
DOI
10.1109/UGIM.1991.148133
Filename
148133
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