DocumentCode :
3555281
Title :
Electrically alterable read-only memory cell with graded energy band-gap insulator
Author :
Hijiya, S. ; Ito, T. ; Nakamura, T. ; Toyokura, N. ; Ishikawa, H.
Author_Institution :
Fujitsu Laboratories, Inc., Kawasaki, Japan
Volume :
26
fYear :
1980
fDate :
1980
Firstpage :
590
Lastpage :
593
Abstract :
Low voltage alterability and excellent memory retention have been obtained with a novel EAROM cell that has a graded energy band-gap film as the first insulator of a Floating-Gate type memory. The graded energy band-gap insulator can enhance charge injection without deteriorating memory retention, because the energy band-gap is narrowed only at the silicon substrate interface. A graded energy band-gap insulator has been realized by thermally oxidizing the surface of a very thin silicon nitride film grown by direct thermal nitridation of a silicon substrate. A fabricated EAROM cell has shown that it can be programmed by a single positive supply of less than 12 V and it has excellent memory retention.
Keywords :
Dielectrics and electrical insulation; EPROM; Energy barrier; Hot carriers; Nonvolatile memory; Photonic band gap; Semiconductor films; Silicon compounds; Substrate hot electron injection; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1980 International
Type :
conf
DOI :
10.1109/IEDM.1980.189902
Filename :
1481345
Link To Document :
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