DocumentCode
3555358
Title
A sub-nanosecond ISL technology demonstrated in a 400 mil × 400 mil VLSI chip
Author
Lamb, D.R. ; Roberts, P.C.T. ; Belt, R. ; Bostick, D. ; Stevens, H. ; Pai, S. ; Burbank, D.
Author_Institution
Honeywell, Systems and Research Center, Minneapolis, Minnesota
fYear
1980
fDate
8-10 Dec. 1980
Firstpage
837
Lastpage
837
Keywords
Belts; Fabrication; Logic devices; Logic gates; Road transportation; Schottky diodes; Semiconductor device measurement; Solid state circuits; Temperature; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1980 International
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/IEDM.1980.189971
Filename
1481414
Link To Document