Title : 
Theoretical and experimental modeling of longitudinal characteristics of TEM cells
         
        
            Author : 
Cai, Xiao-Ding ; Costache, George I.
         
        
            Author_Institution : 
Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
         
        
        
            fDate : 
July 12 1991-Aug. 16 1991
         
        
        
        
            Abstract : 
Longitudinal characteristics of transverse electromagnetic (TEM) cells include longitudinal variations of electric field and impedance. These characteristics have only been observed in an in-depth experimental investigation reported by Crawford et al. (1974,1977). A theoretical approach to model these characteristics is presented. Their relations with voltage standing wave ratio (VSWR), loss, terminal load impedance, characteristic impedance, and cell dimensions are reflected in expressions derived. Numerical results agree well with reported experimental data at some frequencies at which full information about the longitudinal variations was obtained with electric field probes. Concepts concerning longitudinal nonuniformity of both field and impedance are proposed and are useful in the evaluation of the longitudinal characteristics of TEM cells in use.<>
         
        
            Keywords : 
electric fields; electric impedance; electromagnetic compatibility; test equipment; test facilities; EMC testing; TEM cells; cell dimensions; characteristic impedance; electric field probes; electric field variations; impedance variations; longitudinal characteristics; terminal load impedance; transverse electromagnetic cell; voltage standing wave ratio; Cutoff frequency; Electromagnetic compatibility; Electromagnetic interference; Impedance; Power transmission lines; Probes; Propagation losses; TEM cells; Transmission line theory; Voltage;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
         
        
            Conference_Location : 
Cherry Hill, NJ, USA
         
        
            Print_ISBN : 
0-7803-0158-7
         
        
        
            DOI : 
10.1109/ISEMC.1991.148172