DocumentCode :
3555398
Title :
Effect of charge, feed, and test cable lengths on R2SPG waveforms
Author :
Hoeft, Lothar O. ; Karaskiewicz, Ronald J. ; Hofstra, Joseph S. ; Prather, William D. ; Ayres, William R.
Author_Institution :
BDM Int. Inc., Albuquerque, NM, USA
fYear :
1991
fDate :
12-16 Aug 1991
Firstpage :
31
Lastpage :
36
Abstract :
The random repetitive squarewave pulse generator (R2SPG) was developed for in situ upset testing of cable connected equipment. This pulser uses a charge line and a vacuum switch to produce a broadband transient that approximates a damped squarewave with a risetime of the order of a few nanoseconds, determined by the impedance discontinuities of the switch, and a ringing frequency that is related to the electrical length of the charge and feed lines. In order to better understand the relationships between the lengths of the charge, feed, and test cables, a controlled experiment was performed that varied each of these independently. The currents induced on the test cable were consistent with a simple transmission line model. The ringing frequency of the pulser, determined by the electrical length of the charge and feed lines, was generally discernible, as was the resonant frequency of the test cable. The peak amplitude of the transient and the decay rate of the pulse spectrum were unaffected by changes in the charge and feed lines
Keywords :
cable testing; electromagnetic compatibility; electromagnetic pulse; transients; broadband transient; cable connected equipment; charge line; damped squarewave; decay rate; feed lines; impedance discontinuities; peak amplitude; pulse spectrum; random repetitive squarewave pulse generator; resonant frequency; ringing frequency; test cable lengths; transmission line model; vacuum switch; Feeds; Frequency; Impedance; Performance evaluation; Power cables; Power system transients; Pulse generation; Switches; Testing; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0158-7
Type :
conf
DOI :
10.1109/ISEMC.1991.148176
Filename :
148176
Link To Document :
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