DocumentCode :
3555511
Title :
The superlattice photodetector: A new avalanche photodiode with a large ionization rates ratio
Author :
Capasso, F. ; Tsang, W.T. ; Hutchinson, A.L. ; Williams, G.F.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
Volume :
27
fYear :
1981
fDate :
1981
Firstpage :
284
Lastpage :
287
Abstract :
The first superlattice avalanche photodiode (APD) is reported. The high field region of this p-i-n structure consists of 50 alternating Al0.45Ga0.55As 550Å) and GaAs (450Å) layers. We find an ionization rates ratio α/β=8 at a gain of 10. The ionization rate ratio enhancement with respect to bulk GaAs and AlGaAs is attributed to the large difference in the band edge discontinuities for electrons and holes at the heterojunction interfaces. The superlattice APD is a new device concept which can also be used to develop low noise APD´s in long wavelength 1.3-1.6µm semiconductors.
Keywords :
Avalanche photodiodes; Charge carrier processes; Electrons; Gallium arsenide; Impact ionization; Molecular beam epitaxial growth; PIN photodiodes; Photodetectors; Semiconductor device noise; Superlattices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1981 International
Type :
conf
DOI :
10.1109/IEDM.1981.190065
Filename :
1482018
Link To Document :
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