DocumentCode :
3555512
Title :
Determination of impact ionization coefficients in InP by analysis of photomultiplication and noise measurements
Author :
Bulman, G.E. ; Cook, L.W. ; Tashima, M.M. ; Stillman, G.E.
Author_Institution :
University of Illinois, Urbana, IL
Volume :
27
fYear :
1981
fDate :
1981
Firstpage :
288
Lastpage :
291
Abstract :
The electron and hole impact ionization coefficients, α and β, respectively have been determined in InP using specially fabricated devices that permit both pure electron and pure hole injection. Ionization coefficients calculated from photocurrent multiplication data for devices with three different active region doping levels indicate a ratio of β/α which decreases from 4.0 to 1.3 for fields of 2.4 to 7.7 × 105V/cm, respectively. Avalanche noise measurements have been performed on the same devices and the results indicate a value of β/α that is generally consistent with the photocurrent multiplication results.
Keywords :
Avalanche photodiodes; Charge carrier processes; Doping; Etching; Impact ionization; Indium phosphide; Laboratories; Noise measurement; Photoconductivity; Pollution measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1981 International
Type :
conf
DOI :
10.1109/IEDM.1981.190066
Filename :
1482019
Link To Document :
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