DocumentCode :
3555519
Title :
Evaporated polycrystalline-silicon thin-film transistors on glass
Author :
Misumi, A. ; Sunahara, K. ; Tanabe, H. ; Kumada, M.
Author_Institution :
Hitachi, Ltd., Chiba, Japan
Volume :
27
fYear :
1981
fDate :
1981
Firstpage :
305
Lastpage :
308
Abstract :
Polycrystalline-silicon thin-film transistors (Polysilicon TFTs) have been fabricated on glass substrate for application in flat-panel displays. In order to make the process temperature as low as possible, and make it possible to use ordinary glass substrate, a coplanar structure was chosen. The polysilicon film was deposited by ultrahigh vacuum evaporation, the gate insulator by RF magnetron sputtering, and instead of standard doping processes like ion implantation, or thermal diffusion, Al vacuum deposition to control the substrate temperature was used for the source-drain electrodes formation. As a result, the highest temperature in the process was 550°C. TFTs which use aluminum oxides in their gate insulators usually operate in the P-channel enhancement mode, and have an OFF resistance of 108Ω and an OFF/ON resistance ratio of 104. If treated with oxygen plasma after formation of the source-drain electrodes, the stability of these devices improves remarkably.
Keywords :
Displays; Electrodes; Glass; Insulation; Plasma stability; Plasma temperature; Radio frequency; Sputtering; Substrates; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1981 International
Type :
conf
DOI :
10.1109/IEDM.1981.190072
Filename :
1482025
Link To Document :
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