DocumentCode :
3555524
Title :
Parasitic capacitances can cause demodulation RFI to differ in inverting and noninverting operational amplifier circuits
Author :
Ghadamabadi, Hamid ; Whalen, James J.
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
fYear :
1991
fDate :
12-16 Aug 1991
Firstpage :
151
Lastpage :
156
Abstract :
The demodulation RFI responses of an inverting operational amplifier (op amp) circuit and a noninverting op amp circuit are compared. The intended voltage gain of the inverting op amp circuit is A1=-R2/R1=-10. The intended linear voltage gain of the noninverting op amp circuit is AN1 =(R1+R2)/R1=11. For both circuits, the resistor values are R1=10 kΩ and R2=100 kΩ. Analysis shows that parasitic capacitances Cin (between the inverting and noninverting inputs of the op amp) and CR1 (shunted across R1) cause the inverting op amp circuit to have better RFI immunity than the noninverting op amp circuit. The derivation is based on the hypothesis that the demodulation RFI response is caused by a second-order nonlinearity so that a 3-dB reduction in the linear voltage gain causes the second-order demodulation RFI response characterized by the transfer function H2 to be reduced by 6 dB. For the assumed values of Cin=8 pF and CR1=0.4 pF. the measured and calculated values of the difference between H2 values for the inverting and noninverting circuits were in good agreement
Keywords :
capacitance; demodulation; operational amplifiers; radiofrequency interference; 10 kohm; 100 kohm; RFI immunity; demodulation RFI responses; inverting operational amplifier; linear voltage gain; noninverting operational amplifier; op amp; parasitic capacitances; second-order nonlinearity; transfer function; voltage gain; Chromium; Circuits; Demodulation; Gain; Operational amplifiers; Parasitic capacitance; Radiofrequency interference; Resistors; Transfer functions; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1991. Symposium Record., IEEE 1991 International Symposium on
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0158-7
Type :
conf
DOI :
10.1109/ISEMC.1991.148203
Filename :
148203
Link To Document :
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