Title : 
ST-CMOS (Stacked Transistors CMOS): A double-poly-NMOS-compatible CMOS technology
         
        
            Author : 
Colinge, J.P. ; Demoulin, E.
         
        
            Author_Institution : 
CNET-CNS, Meylan, France
         
        
        
        
        
        
        
            Abstract : 
A modified double-poly NMOS technology is proposed, providing CMOS structures. The P-channel transistors are made in the second poly layer. The process scheme is standard, except for the laser annealing step. A method of laser annealing of processed [even non-planar] samples is derived, giving rise to a concept of selective annealing. Hole mobility up to 120 cm2/V.S, was reached in the polysilicon transistors. The characteristics of the bulk N-channel transistors are kept unmodified by laser exposure.
         
        
            Keywords : 
Annealing; CMOS technology; Chemical lasers; Chemical technology; MOS devices; Nonhomogeneous media; Optical device fabrication; Silicon; Substrates; Very large scale integration;
         
        
        
        
            Conference_Titel : 
Electron Devices Meeting, 1981 International
         
        
        
            DOI : 
10.1109/IEDM.1981.190144