• DocumentCode
    3555625
  • Title

    Electron drift velocities in In0.53Ga0.47As at very high electric fields

  • Author

    Windhorn, T.H. ; Cook, L.W. ; Stillman, G.E.

  • Author_Institution
    University of Illinois at Urbana-Champaign, Urbana, Illinois
  • Volume
    27
  • fYear
    1981
  • fDate
    1981
  • Firstpage
    641
  • Lastpage
    644
  • Abstract
    Electron drift velocities in GaAs and in In0.53Ga0.47As have been experimentally determined using a microwave time-of-flight technique. Drift velocities in GaAs have been measured at temperatures from 95 K to 385 K for electric field strengths in excess of 160 kV/cm at most temperatures and as high as 236 kV/cm at 300 K. Measurements of electron drift velocities at various temperatures in In0.53Ga0.47As for field strengths of up to 150 kV/cm show a larger negative differential mobility, higher peak to valley ratio, and lower saturation velocity than is obtained with GaAs.
  • Keywords
    Electric variables measurement; Electron mobility; Epitaxial layers; Gallium arsenide; Indium phosphide; Laboratories; Schottky barriers; Schottky diodes; Substrates; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1981 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1981.190167
  • Filename
    1482120