DocumentCode
3555625
Title
Electron drift velocities in In0.53 Ga0.47 As at very high electric fields
Author
Windhorn, T.H. ; Cook, L.W. ; Stillman, G.E.
Author_Institution
University of Illinois at Urbana-Champaign, Urbana, Illinois
Volume
27
fYear
1981
fDate
1981
Firstpage
641
Lastpage
644
Abstract
Electron drift velocities in GaAs and in In0.53 Ga0.47 As have been experimentally determined using a microwave time-of-flight technique. Drift velocities in GaAs have been measured at temperatures from 95 K to 385 K for electric field strengths in excess of 160 kV/cm at most temperatures and as high as 236 kV/cm at 300 K. Measurements of electron drift velocities at various temperatures in In0.53 Ga0.47 As for field strengths of up to 150 kV/cm show a larger negative differential mobility, higher peak to valley ratio, and lower saturation velocity than is obtained with GaAs.
Keywords
Electric variables measurement; Electron mobility; Epitaxial layers; Gallium arsenide; Indium phosphide; Laboratories; Schottky barriers; Schottky diodes; Substrates; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1981 International
Type
conf
DOI
10.1109/IEDM.1981.190167
Filename
1482120
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