Title :
An EAROM cell with a stacked gate and a single diffused layer
Author :
Takei, Akira ; Hika, Yoshihiko ; Miida, Takashi
Author_Institution :
Fujitsu Limited, Kawasaki, Japan
Keywords :
Avalanche breakdown; Character generation; EPROM; Electrons; Flip-flops; Silicon; Space vector pulse width modulation; Threshold voltage; Tunneling; Writing;
Conference_Titel :
Electron Devices Meeting, 1981 International
DOI :
10.1109/IEDM.1981.190187
