Title :
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation
Author :
Mao, Weiwei ; Ciletti, Michael D.
Author_Institution :
Dept. of Electr. Eng., Colarado Univ., Colorado Springs, CO, USA
Abstract :
The authors present a self-learning algorithm using a dynamic testability measure to accelerate test generation. They introduce the concepts of full-logic-value label-backward implication, dependent backtrack, and K-limited backtracks. Results indicating a high fault coverage are presented for ten benchmark combinational circuits.<>
Keywords :
combinatorial circuits; logic testing; DYTEST; K-limited backtracks; benchmark combinational circuits; dependent backtrack; dynamic testability measures; full-logic-value label-backward implication; high fault coverage; self-learning algorithm; test generation acceleration; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Electric variables measurement; Heuristic algorithms; Life estimation; Logic; Observability; Springs;
Conference_Titel :
Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-8186-0864-1
DOI :
10.1109/DAC.1988.14822
