Title :
Device technology comparison in the context of large scale digital applications
Author :
McGroddy, James C. ; Solomon, Paul M.
Author_Institution :
IBM T. J. Watson Research Center, Yorktown Heights, New York
Keywords :
Circuits; Digital systems; Electrodes; FETs; Heterojunctions; Large-scale systems; MOSFETs; Material properties; Ring oscillators; Voltage control;
Conference_Titel :
Electron Devices Meeting, 1982 International
DOI :
10.1109/IEDM.1982.190195
