DocumentCode
355573
Title
Quality distribution and yield theory for diode laser fabrication
Author
Wu, Yimin A. ; Chang-Hasnain, Connie J.
Author_Institution
Edward L. Ginzton Lab., Stanford Univ., CA, USA
fYear
1996
fDate
7-7 June 1996
Firstpage
170
Lastpage
171
Abstract
Summary form only given. We present a yield theory. This theory is compared with a large number of sets of experimental data of both vertical cavity surface emitting lasers (VCSELs) and edge emitting semiconductor lasers.
Keywords
integrated circuit yield; laser cavity resonators; laser theory; optical fabrication; quality control; semiconductor device models; semiconductor device reliability; semiconductor laser arrays; semiconductor technology; surface emitting lasers; diode laser fabrication; edge emitting semiconductor lasers; quality distribution; vertical cavity surface emitting lasers; yield theory; Curve fitting; Diode lasers; Histograms; Laser stability; Laser theory; Optical device fabrication; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-55752-444-0
Type
conf
Filename
865724
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