Title :
Quality distribution and yield theory for diode laser fabrication
Author :
Wu, Yimin A. ; Chang-Hasnain, Connie J.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Abstract :
Summary form only given. We present a yield theory. This theory is compared with a large number of sets of experimental data of both vertical cavity surface emitting lasers (VCSELs) and edge emitting semiconductor lasers.
Keywords :
integrated circuit yield; laser cavity resonators; laser theory; optical fabrication; quality control; semiconductor device models; semiconductor device reliability; semiconductor laser arrays; semiconductor technology; surface emitting lasers; diode laser fabrication; edge emitting semiconductor lasers; quality distribution; vertical cavity surface emitting lasers; yield theory; Curve fitting; Diode lasers; Histograms; Laser stability; Laser theory; Optical device fabrication; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers; Voltage;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-444-0
