DocumentCode :
3555763
Title :
HgCdTe CCD area arrays for infrared imaging in the 3-5 µm spectral region
Author :
Cederberg, A.A. ; Borrello, S.R.
Author_Institution :
Texas Instruments Incorporated, Dallas, Texas
fYear :
1982
fDate :
13-15 Dec. 1982
Firstpage :
149
Lastpage :
152
Abstract :
Monolithic HgCdTe charge coupled device (CCD) area arrays are being developed for scanning imaging systems in the 3-5 µm spectral region. The CCD arrays studied have: 1) multiple parallel columns composed of CCD shift registers which perform the time-delay-and-integrate (TDI) function when operated in a scanning mode, and 2) CCD multiplexers for signal readout. The first prototype imagery from a 32 × 16 HgCdTe CCD (5 µm cutoff wavelength) array will be presented. Bar pattern imagery for a 16 × 4 CCD array will be shown. The imaging demonstrations have been made using pulsed illumination in the staring mode. Results showing nearly linear IR flux integration by all sixteen columns of a 32 × 16 CCD array will be included. An evaluation of blooming in the 16 × 4 array revealed that flux equivalent to a target temperature of 390 K caused no significant column-to-column or pixel-to-pixel blooming for single pixel illumination.
Keywords :
Charge coupled devices; Dark current; Degradation; Geometry; Infrared imaging; Multiplexing; Prototypes; Shift registers; Signal generators; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1982 International
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/IEDM.1982.190237
Filename :
1482771
Link To Document :
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