DocumentCode
3555773
Title
A GaP/Alx Gal-x P heterojunction bipolar junction transistor for high-temperature electronic applications
Author
Zipperian, T.E. ; Dawson, L.R.
Author_Institution
Sandia National Laboratories, Albuquerque, New Mexico
Volume
28
fYear
1982
fDate
1982
Firstpage
181
Lastpage
184
Abstract
Useful bipolar transistor action over the full temperature range from 78 to 823K has been demonstrated for mesa-isolated, liquid-phase epitaxial n+npn, GaP/ Al0.35 Ga0.65 P/GaP/GaP structures. This represents both the highest temperature and the widest temperature range (745K) over which useful solid-state transistor action has ever been demonstrated in any III-V compound semiconductor system. These results imply that the GaP/Alx Ga1-x P chemical system is an excellent materials candidate in which to base a technology for high-temperature electronics and the results also imply the very real possibility of functional solid-state devices and circuits at temperatures in excess of 500°C.
Keywords
Bipolar transistors; Chemical technology; Contacts; Gold; Heterojunction bipolar transistors; Laboratories; Semiconductor materials; Solid state circuits; Space technology; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1982 International
Type
conf
DOI
10.1109/IEDM.1982.190246
Filename
1482780
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