• DocumentCode
    3555773
  • Title

    A GaP/AlxGal-xP heterojunction bipolar junction transistor for high-temperature electronic applications

  • Author

    Zipperian, T.E. ; Dawson, L.R.

  • Author_Institution
    Sandia National Laboratories, Albuquerque, New Mexico
  • Volume
    28
  • fYear
    1982
  • fDate
    1982
  • Firstpage
    181
  • Lastpage
    184
  • Abstract
    Useful bipolar transistor action over the full temperature range from 78 to 823K has been demonstrated for mesa-isolated, liquid-phase epitaxial n+npn, GaP/ Al0.35Ga0.65P/GaP/GaP structures. This represents both the highest temperature and the widest temperature range (745K) over which useful solid-state transistor action has ever been demonstrated in any III-V compound semiconductor system. These results imply that the GaP/AlxGa1-xP chemical system is an excellent materials candidate in which to base a technology for high-temperature electronics and the results also imply the very real possibility of functional solid-state devices and circuits at temperatures in excess of 500°C.
  • Keywords
    Bipolar transistors; Chemical technology; Contacts; Gold; Heterojunction bipolar transistors; Laboratories; Semiconductor materials; Solid state circuits; Space technology; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1982 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1982.190246
  • Filename
    1482780