DocumentCode :
3555893
Title :
High speed-low power GaAs/AlGaAs TEGFET integrated circuit
Author :
Linh, Nuyen T. ; Tung, Pham N. ; Delabeaudeuf, D. ; Delescluse, P. ; Laviron, M.
Author_Institution :
Thomson-CSF Central Research Laboratory, Orsay, France
Volume :
28
fYear :
1982
fDate :
1982
Firstpage :
582
Lastpage :
585
Abstract :
Two-dimensional electron gas FETs (TEGFETs) have been used to fabricate DCFL circuits. The MBE wafers are processed as-grown without any recessed gate etching nor self-aligned implantation. Source, drain and gate are directly deposited on the wafer to realize enhancement-mode FETs whereas loads are ungated transistors. With delay times of 18.4 and 32.5 ps at 300 K for 0.9 and 0.032 mW respectively, TEGFETis the fastest semiconductor device amd present very low power dissipation. It is shown that these performances are still limited by contact resistance and material quality. Improvements of these parameters will lead to delay time of ∼9 ps at 300 K for 0.7 \\\\mu m gate length. The high performance and the simplicity of the process involved, make the TEGFET very suitable for LSI/VLSI applications.
Keywords :
Contact resistance; Delay; Etching; FETs; Gallium arsenide; HEMTs; High speed integrated circuits; MODFETs; Power dissipation; Semiconductor devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1982 International
Type :
conf
DOI :
10.1109/IEDM.1982.190359
Filename :
1482893
Link To Document :
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